Contributions > By Session
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Challenges and Opportunities - Focused Ion Beam Processing at the Nano-scale
Jacques Gierak
sciencesconf.org:coldbeams:9709 |
FIB Assembly of Semiconductor Nanostructures for Potential Nanoelectronic Device Applications
Robert Hull
sciencesconf.org:coldbeams:9799 |
Incredible focused ion beams - iFib -
Alois Lugstein
sciencesconf.org:coldbeams:9805 |
The Liquid Metal Ion Source – A Hot Ion Source
Jon Orloff
sciencesconf.org:coldbeams:9808 |
Nano aperture ion source
Leon van Kouwen
sciencesconf.org:coldbeams:9858 |
Focused Ion Beams : A tool for Nanomachining and Advanced Transmission Electron Microscopy
Gérard BenAssayag
sciencesconf.org:coldbeams:9903 |
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